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硝酸浓度对硅晶片腐蚀速率的影响
引言薄晶片已经成为各种新型微电子产品的基本需求。其中包括功率器件、分立半导体、光电元件和用于射频识别系统的集成电路。机械研磨是最常见的晶圆减薄技术,因为其减薄率很高。新的微电子产品要求硅晶片厚度减薄到150米以下。机械研磨仍然会在晶片表面产...
有机酸清洗液中的铜
用电化学和原子力显微镜方法对有机酸与铜的相互作用进行了表征可以建立用于湿铜加工的高效清洗公式。本文研究了单有机酸、二有机酸和三有机酸中铜的蚀刻速率和氧化机理。除了草酸的钝化性能外,其他铜的电化学行为都观察出类似的电化行为。有机酸与稀释的氢氟...
用于刻蚀多晶硅表面的HF-HNO3-H2SO4/H2O混合物
硅表面常用的HF-HNO3-H2O蚀刻混合物的反应行为因为硫酸加入而受到显著影响。HF (40%)-HNO3 (65%)-H2SO4 (97%)混合物的最大蚀刻速率为4000–5000 NMS-1,w (40%-HF)/w (65%-HNO...
氢氟酸蚀刻后氧化碳化硅表面的化学性质
Abstract:Hydrogen termination of oxidized silicon in hydrofluoric acid results from an etching processthat is now well u...
硅晶片的酸刻蚀
Polished silicon wafers are prepared through various mechanical and chemical processes. First, the silicon single-crysta...
磷酸中二氧化硅的选择性湿法蚀刻方法
In the semiconductor manufacturing, silicon nitride (Si3N4) and silicon dioxide (SiO2) are the most typical and widely-u...
磷酸湿化学蚀刻改进多晶硅片太阳能电池的方法
1. Introduction Silicon nitride (SiN) thin films are widely used in various microelectronic and optoelectronic devices ...
磷酸电解液中铜电解抛光的机理研究
ExperimentalExperiments were performed on two different samples, standard Cu rotating disk electrodes from Pine Instrume...
碳酸氢钠溶液氧化单晶硅太阳能电池的研究
1 INTRODUCTION The photovoltaic technology is well established as a reliable and economical one for small sources of e...
硫酸-过氧化氢-水系统中砷化镓的化学蚀刻
1. Introduction Investigation of the chemical etching of (100) GaAs in a solution consisting of sulphuric acid, hydroge...