溅射法中的生长薄膜及其应用

时间:2023-07-19 09:12:07 浏览量:0

During the last decade the dc and rf sputtering techniques have been used extensively in  their two configurations — balanced and unbalanced magnetron. The main applications  have been in the fields of industry and research. Examples of industrial applications are:  decorative thin films (Raymond & Baham, 1999), hard wear-resistant thin films (Rodil &  Olaya, 2006), low-friction thin films (Heimberg et al., 2001) corrosion-resistant thin films  (Flores et al., 2006), and thin films used as a protective optical system (Stefan et al., 2008), as  well as maybe the most interesting applications, thin films used in the electronic industry  (Monroy et al., 2011). In the research field, the investigation has been oriented toward  understanding the main physical mechanisms, such as: interaction between charged  particles and the surface of the target material, adherence between the substrate and the  deposited material, and chemical reactions near the substrate, as well as the influence of the  deposit parameters (substrate temperature, working pressure, density power applied to the  target). This research has produced thin films with a high degree of crystallinity and with  the possibility of various industrial applications.


Moreover, researchers have made an effort to improve the system of operation. These efforts  have been initiated through the so-called conventional or balanced magnetron sputtering in  the early 1970s (Waits R, 1978), followed by the development of unbalanced systems in the  late 1980s (Window, 1986) and its incorporation into multi-source “closed-field” systems in  the early 1990s (Teer, 1989). Finally, the sputtering technique can increase the rate of  deposition and ion energy by applying a unipolar high power pulse of low frequency and  low duty cycle to the cathode target, referred to as high-power impulse magnetron  sputtering (HiPIMS) or high-power pulsed magnetron sputtering (HPPMS). Common to all  highly ionized techniques is very high density plasma. Implementing these discharges in  sputter deposition technology modifies the surface of components, bringing improvements  in mechanical, chemical, optical, electronic, and many other properties of the material. Highcurrent glows are transient discharges operating at simultaneously high voltage (> 300 V)  and high current density (> 100mAcm−2). They have recently proven successful for the  deposition of thin-film materials. These developments have made it possible to have an  exceptionally versatile technique, suitable for the deposition of high-quality, well-adhered  films of a wide range of materials with high rates of deposition. Table 1 show the main  applications obtained in the last decade with the magnetron sputtering (balanced and  unbalanced) rf and dc versions.


In dc (diode) discharge, the cathode electrode is the sputtering target and the substrate is  placed on the anode, which is often at ground potential (Vossen &Cuomo, 1978). The  applied potential appears across a region very near the cathode, and the plasma generation  region is near the cathode surface. The cathode in dc discharge must be an electrical  conductor, since an insulating surface will develop a surface charge that will prevent ion  bombardment of the surface. This condition implies that dc sputtering must be used to  sputter simple electrically conductive materials such as metals, although the process is  rather slow and expensive compared to vacuum deposition. An advantage of dc sputtering  is that the plasma can be established uniformly over a large area, so that a solid large-area  vaporization source can be established.


On the other hand, in dc sputtering the electrons that are ejected from the cathode are  accelerated away from the cathode and are not efficiently used for sustaining the discharge.  To avoid this effect, a magnetic field is added to the dc sputtering system that can deflect the  electrons to near the target surface, and with appropriate arrangement of the magnets, the electrons can be made to circulate on a closed path on the target surface. This high current of  electrons creates high-density plasma, from which ions can be extracted to sputter the target  material, producing a magnetron sputter configuration (Penfold, 1995). A disadvantage of  the magnetron sputtering configuration is that the plasma is confined near the cathode and  is not available to active reactive gases in the plasma near the substrate for reactive sputter  deposition. This difficulty can be overcome using an unbalanced magnetron configuration  (see Fig. 1), where the magnetic field is such that some electrons can escape from the  cathode region (Windows & Savvides, 1986). A disadvantage of the unbalanced magnetron  is that the current of escaping electrons is not uniform, and the plasma generated is not  uniform.


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Fig1


It is important to state that in all the cases discussed above, the target and the substrate were  facing (on- axis sputtering). In this configuration, the highly energetic electrons irradiate the  substrates and/or the growing surface of the thin films during deposition. Off-axis  sputtering reduces the effects of the irradiation of the high-energy particles. In off-axis  sputtering, the substrates are settled at the outside of the discharge plasma. The thickness  distribution of thin films deposited by off-axis sputtering will be larger than that for on-axis  sputtering. A rotating substrate holder with a metal shadow mask is used for the reduction  of the thickness distribution of the off-axis sputtering. Under a suitable design, the thickness  distribution is less than 2% for substrates of 100 × 100 mm in an rf sputtering system using a  5-inch target.


In this chapter we will present the physical parameters involved in the growth of thin films;  also discussed will be the influence that the growth parameters have on the degree  crystallinity of the films, the chemical characterization, and the optical characterization of  the films; and finally, we will discuss the residual stress, hardness, and corrosion and wear  resistance of thin films.


The main physical phenomenon involved in the sputtering technique is the momentum  transfer between energetic atomic-sized particles (usually ions of noble gases) and the atoms  of the surface of the material (target). During the interchange of momentum, many effects  can be produced on the elastic and inelastic collisions; in the first kind of collision, mainly  reflected particles can be found (neutrals, ions of the target and the gas). In the second kind,  the collisions can present secondary electrons, UV/visible photons, X-ray and implanted  particles; schematically, Fig. 3 shows different processes that may occur during the  interaction between charged particles and the surface of the material.

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